MSE 7130
Advanced Electron Microscopy
Course Description
Pre-Requisite(s):
MSE 6130 or instructor permission
Emphasis placed on the applications of advanced techniques of transmission and scanning electron microscopy to modern research problems in materials science and engineering. Microdiffraction and microanalysis, lattice imaging, and convergent beam diffraction in TEM and STEM are treated. In SEM, quantitative probe analysis techniques and back scattered electron imaging and channeling are covered.
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